Test Services

• In-circuit Test Program Development
• Fixture Design and construction
• Design for Testability
• Custom Model Development
• Accessibility
• Vectorless testing with HP Testjet™ Technology
• LED state and color detection

Programming Services

• Boundary Scan Testing
• ISP and FLASH programming
• Cost saving MDA test solution
• Modeling of non-library devices
• Cluster testing
• Panel testing

CAD Services

• Accept many standard CAD formats
• Identify and report testability issues and net coverage
• Testpoint assignment based upon customer preference,
  probe size and accessibility location.

Support Services

• Implementation of engineering changes to existing
  programs
• Design for testability analysis
• Fixture preventative maintenance
• Fixture refurbishment
• On-site engineering support (short or long term)

Test Coverage Options

At DTS we know that your test needs and cost are a big factor. So we try to be as flexible as possible. We can offer several test options to best suit your needs. Development starts with the Basic Test Program and then you can build upon this by adding the Options. Below is a brief description of each option.

• Basic Test Program

This is a standard HP (Agilent) test program. It will test Shorts, Opens, Analog Components and all digital devices listed in the HP (Agilent) library. As well as any device found in the DTS library. Test coverage and cost rivals that of Teradyne in-circuit tests.

• Options

• Non-Library Devices. The software developed verifies that the device is installed, it is positioned correctly and if possible a partial functional test. This may also be accomplished with the use of Testjet™.
• This can also be used to check polarized capacitors. 
• Boundary Scan testing depends upon several factors; board design, device design and availability/correctness of BSDL files from the device manufacturer.
• In-System Programming. This feature will program FLASH memory, EEPROM and ISP capable devices during in-circuit testing. This requires that the board design meet DFT requirements.
• Limited Access. Components such as resistors, inductors and filters that lack access can be covered with features such as Agilent's Drivethru technique. Cluster testing is also an option.

Test Fixtures

Dynamic Test Services contracts out the fabrication of test fixtures. We work with most fixture suppliers throughout the United States. If you as our customer have a preference, will will contract with the fixture supplier of your choice.

We also do fixture refurbishment and ECO's.