HP3070

 

Teradyne

 

Mentor Graphics

(formerly)
Router Solutions Incorperated

Circuit board testing

• In-circuit Test Program Development for HP3070 and Teradyne 18xx

• Fixture Design and construction

• Design for Testability

• Custom Model Development

• Accessibility

• Vectorless testing with HP Testjet™ Technology (Teradyne Framescan)

• LED state and color detection

• Test & Tag (circuit board testing)

Programming Services

• Boundary Scan Testing

• ISP and FLASH programming

• Cost saving MDA test solution

• Modeling of non-library devices

• Cluster testing

• Panel testing

CAD Services

• Accept most standard CAD formats
• Identify and report testability issues and net coverage
• Testpoint assignment based upon customer preference,
  probe size and accessibility location.

Support Services

• Implementation of engineering changes to existing programs
• Design for testability analysis
• Fixture preventative maintenance
• Fixture refurbishment
• On-site engineering support (short or long term)

Program coverage update - what this means is that if you find a failure at functional test or system test, we will evaluate why ICT is not catching that failure. There are many reasons why it might happen (test point access, board topology, surrounding circuitry, tolerance, etc). If possible, we can update the program to catch this failure before it gets to functional test. Troubleshooting ICT failures is much easier than functional because of the component level test and reporting. Even is cluster testing is needed to catch the failure a message can be output to alert the technician to look for that problem. These are normal development practices at Dynamic Test Services, but not all failures can be configured during development. So it is best to provide feedback to DTS so we can give you the best product possible.

Test Coverage Options

At DTS we know that your test needs and cost are a big factor. So we try to be as flexible as possible. We can offer several test options to best suit your needs. Development starts with the Basic Test Program and then you can build upon this by adding the Options.

With cost being such a factor in today's economy, we understand companies are cutting back on test services opting for either ICT or functional test only. At Dynamic Test we can work with you to to develop a test strategy for optimum device coverage using both tests while keeping costs to a minimum. We can look at what functional test is covering and develop the in-circuit test program to focus on areas that functional might miss or be hard to troubleshoot when failing. This would be along the lines of a standard MDA test with additional attention to the areas that functional misses. This helps reduce troubleshooting time and bone pile build up.

Test Fixtures

Dynamic Test Services contracts out the fabrication of test fixtures. We work with most fixture suppliers throughout the United States. If you as our customer have a preference, will will contract with the fixture supplier of your choice.

We have experience with X-probe fixtures to gain more access to your board increasing test coverage and moving product.

We also do fixture refurbishment and ECO's.